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Tag Archives: Atomic Force Microscopes Market

Atomic Force Microscopy Represents Improved Resolution Microscopy Technique

Atomic Force Microscopes

Atomic force microscopes refer to the scanning probe microscopes that are designed to measure several properties such as height, magnetism and friction with the help of a probe. This type of microscope measures the local property simultaneously by scanning the probe over a small area of the sample. Atomic force microscopy (AFM) shares its key components with the scanning microscopy ... Read More »